What is this about?


NEMESYS is an experimental project designed to study the effects of cosmic radiations and atmospherical events on memory systems. In particular, its aim is to correlate bit-flips in memories with strong radiation events and particles' impacts on them.

The experiment is supposed to participate in the REXUS/BEXUS Programme.
It will be brought at high altitudes with a balloon together with several other experiments, where it will collect data about the impact of particles and cosmic radiations and eventual atmospherical events like lightnings.

Why is it important?



Reliability and safety are extremely important aspects of many critical electronic applications, such as space, avionics, and military. Sources of uncertainty must be properly studied and approached when designing electronic devices used in these fields.

As time flows, technology advancements let us create more and more sophisticated and small electronic devices. But the smaller the electronics become, the more they are affected by artificial and natural disturbances.

Some natural events, like particles generated by extreme atmospherical conditions or cosmic radiations, still need to be better analysed and studied. Learning how they affect even simple electronic equipment like a memory device can help engineers design more reliable electronic devices we commonly use.


How It Works


The NEMESYS Experiment is primarily composed of modular devices, because one of the aims of our project is to create something easy to use and replicate, possibly not too expensive.
This way, anyone could use the experimental setup we propose to gather data while at high altitudes. Data could be then even collected on a single website, such as this, and used to map cosmic radiations all over the world.

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Our Team


Dario Asciolla

B.Sc. Student in Electroing Engineering

Tiziano Fiorucci

M.Sc. Student in ICT & Internet Engineering

Elena Grosso

B.Sc. Student in Electronic Engineering

Carla Marzullo

B.Sc. Student in Electronic Engineering


Alessandro Scaramella

M.Sc. Student in Electronic Engineering

Federico Semeraro

M.Eng. Student in Aeronautical Engineering

Simone Stramaccioni

B.Sc. Student in Electronic Engineering

Alessia Zibecchi

M.Sc. Student in Electronic Engineering

 

Tutor Professors


Prof. Marco Ottavi

Professor of "Reliability of VLSI systems and components"
Department of Electronics Engineering
University of Tor Vergata

Prof. Luca Di Nunzio

Department of Electronics Engineering
University of Tor Vergata

Prof. Giancarlo Cardarilli

Department of Electronics Engineering
University of Tor Vergata

Prof. Marco Re

Department of Electronics Engineering
University of Tor Vergata

 



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